Quality Control for Producing More Powerful Solar Cells
A new tool to measure the photoluminescence of Solar Cells,
quickly and with more flexibility than ever before
The Technology
is available under licence for Free
Highly contaminated or defect-rich silicon such as Thin Film or at grain boundaries in multicrystalline silicon, has very short minority carrier lifetimes of often less than 1 μs.
Up until now accurate measurement of the silicon quality with commonly-used techniques has been a challenge as they are limited to longer lifetimes and larger probing areas. Often results are beyond the speed and sensitivity of the typically-used detectors and electronics making quality control difficult.
UNSW Australia researchers have developed a new multi-function Photoluminescence tool that provides the flexibility required to accurately test difficult samples and regions of particular interest.
Key Benefits
• Time resolved measurement, minority carrier lifetime of 1 ns to beyond 1 ms.
• High light sensitivity and a wide dynamic range.
• Useful over a range of wavelengths with high resolution.
• Focus on small spots on the test sample of less than 40 µm in diameter.
• Temperature control of the sample during testing.
Applications
• Quality control and Lifetime Testing of multi-crystalline or thin film cells.
• Detailed testing for regions of interest within cells (e.g. grain boundaries).
• Quality control of other semiconductor devices.
The Opportunity
This technology is available for free as an
Easy Access Licence to companies and individuals.
Click here for a PDF print version of this technology information
For more information contact:
Daniel Gronowski
Business Development Manager
NewSouth Innovations
Ref 14_2959
T: +61 2 9385 7772 l M: +61 415 044 589
E: d.gronowski@nsinnovations.com.au